X-ray Diffraction and Piezoelectric Studies during Tensile Stress on Epoxy/SbSI Nanocomposite

In this paper, the performance of epoxy/SbSI nanocomposite under tensile stress was investigated. X-ray diffraction studies show the main stress mode has shear nature in the case of elastic deformation, while a combination of shear and tensile stress during plastic deformation caused lattice deforma...

Full description

Bibliographic Details
Main Authors: Marcin Godzierz, Bartłomiej Toroń, Piotr Szperlich, Piotr Olesik, Mateusz Kozioł
Format: Article
Language:English
Published: MDPI AG 2022-05-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/22/10/3886