A New, Fast Pseudo-Random Pattern Generator for Advanced Logic Built-In Self-Test Structures
Digital cores that are currently incorporated into advanced Systems on Chip (SoC) frequently include Logic Built-In Self-Test (LBIST) modules with the Self-Test Using MISR/Parallel Shift Register Sequence Generator (STUMPS) architecture. Such a solution always comprises a Pseudo-Random Pattern Gener...
| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-10-01
|
| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/11/20/9476 |