A Phase Retrieval Method for 3D Shape Measurement of High-Reflectivity Surface Based on π Phase-Shifting Fringes
Fringe projection profilometry (FPP) has been widely used for 3D reconstruction, surface measurement, and reverse engineering. However, if the surface of an object has a high reflectivity, overexposure can easily occur. Image saturation caused by overexposure can lead to an incorrect intensity of th...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-10-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/23/21/8848 |