Study on the Technology Trend Screening Framework Using Unsupervised Learning

Outliers that deviate from a normal distribution are typically removed during the analysis process. However, the patterns of outliers are recognized as important information in the outlier detection method. This study proposes a technology trend screening framework based on a machine learning algori...

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Bibliographic Details
Main Authors: Junseok Lee, Sangsung Park, Juhyun Lee
Format: Article
Language:English
Published: MDPI AG 2022-09-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/12/17/8920