Study on the Technology Trend Screening Framework Using Unsupervised Learning

Outliers that deviate from a normal distribution are typically removed during the analysis process. However, the patterns of outliers are recognized as important information in the outlier detection method. This study proposes a technology trend screening framework based on a machine learning algori...

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Main Authors: Junseok Lee, Sangsung Park, Juhyun Lee
Format: Article
Language:English
Published: MDPI AG 2022-09-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/12/17/8920
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author Junseok Lee
Sangsung Park
Juhyun Lee
author_facet Junseok Lee
Sangsung Park
Juhyun Lee
author_sort Junseok Lee
collection DOAJ
description Outliers that deviate from a normal distribution are typically removed during the analysis process. However, the patterns of outliers are recognized as important information in the outlier detection method. This study proposes a technology trend screening framework based on a machine learning algorithm using outliers. The proposed method is as follows: first, we split the dataset by time into training and testing sets for training the Doc2Vec model. Next, we pre-process the patent documents using the trained model. The final outlier documents are selected from the preprocessed document data, through voting for the outlier documents extracted using the IQR, the three-sigma rule, and the Isolation Forest algorithm. Finally, the technical topics of the outlier documents extracted through the topic model are identified. This study analyzes the patent data on drones to describe the proposed method. Results show that, despite cumulative research on drone-related hardware and system technology, there is a general lack of research regarding the autonomous flight field.
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spelling doaj.art-6a41ca3f6d7b476aafcc7808e236e9302023-11-23T12:49:09ZengMDPI AGApplied Sciences2076-34172022-09-011217892010.3390/app12178920Study on the Technology Trend Screening Framework Using Unsupervised LearningJunseok Lee0Sangsung Park1Juhyun Lee2Machine Learning Big Data Institute, Korea University, Seoul 02841, KoreaDepartment of Big Data and Statistics, Cheongju University, Cheongju 28503, KoreaInstitute of Engineering Research, Korea University, Seoul 02841, KoreaOutliers that deviate from a normal distribution are typically removed during the analysis process. However, the patterns of outliers are recognized as important information in the outlier detection method. This study proposes a technology trend screening framework based on a machine learning algorithm using outliers. The proposed method is as follows: first, we split the dataset by time into training and testing sets for training the Doc2Vec model. Next, we pre-process the patent documents using the trained model. The final outlier documents are selected from the preprocessed document data, through voting for the outlier documents extracted using the IQR, the three-sigma rule, and the Isolation Forest algorithm. Finally, the technical topics of the outlier documents extracted through the topic model are identified. This study analyzes the patent data on drones to describe the proposed method. Results show that, despite cumulative research on drone-related hardware and system technology, there is a general lack of research regarding the autonomous flight field.https://www.mdpi.com/2076-3417/12/17/8920patent analysisdroneDoc2Vectopic modeloutlier
spellingShingle Junseok Lee
Sangsung Park
Juhyun Lee
Study on the Technology Trend Screening Framework Using Unsupervised Learning
Applied Sciences
patent analysis
drone
Doc2Vec
topic model
outlier
title Study on the Technology Trend Screening Framework Using Unsupervised Learning
title_full Study on the Technology Trend Screening Framework Using Unsupervised Learning
title_fullStr Study on the Technology Trend Screening Framework Using Unsupervised Learning
title_full_unstemmed Study on the Technology Trend Screening Framework Using Unsupervised Learning
title_short Study on the Technology Trend Screening Framework Using Unsupervised Learning
title_sort study on the technology trend screening framework using unsupervised learning
topic patent analysis
drone
Doc2Vec
topic model
outlier
url https://www.mdpi.com/2076-3417/12/17/8920
work_keys_str_mv AT junseoklee studyonthetechnologytrendscreeningframeworkusingunsupervisedlearning
AT sangsungpark studyonthetechnologytrendscreeningframeworkusingunsupervisedlearning
AT juhyunlee studyonthetechnologytrendscreeningframeworkusingunsupervisedlearning