Analysis of Single Event Effects on Embedded Processor
The continuous scaling of electronic components has led to the development of high-performance microprocessors which are even suitable for safety-critical applications where radiation-induced errors, such as single event effects (SEEs), are one of the most important reliability issues. This work foc...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-12-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/10/24/3160 |