Analysis of Single Event Effects on Embedded Processor
The continuous scaling of electronic components has led to the development of high-performance microprocessors which are even suitable for safety-critical applications where radiation-induced errors, such as single event effects (SEEs), are one of the most important reliability issues. This work foc...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-12-01
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| Series: | Electronics |
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| Online Access: | https://www.mdpi.com/2079-9292/10/24/3160 |
| _version_ | 1797505186297544704 |
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| author | Sarah Azimi Corrado De Sio Daniele Rizzieri Luca Sterpone |
| author_facet | Sarah Azimi Corrado De Sio Daniele Rizzieri Luca Sterpone |
| author_sort | Sarah Azimi |
| collection | DOAJ |
| description | The continuous scaling of electronic components has led to the development of high-performance microprocessors which are even suitable for safety-critical applications where radiation-induced errors, such as single event effects (SEEs), are one of the most important reliability issues. This work focuses on the development of a fault injection environment capable of analyzing the impact of errors on the functionality of an ARM Cortex-A9 microprocessor embedded within a Zynq-7000 AP-SoC, considering different fault models affecting both the system memory and register resources of the embedded processor. We developed a novel Python-based fault injection platform for the emulation of radiation-induced faults within the AP-SoC hardware resources during the execution of software applications. The fault injection approach is not intrusive, and it does not require modifying the software application under evaluation. The experimental analyses have been performed on a subset of the MiBench benchmark software suite. Fault injection results demonstrate the capability of the developed method and the possibility of evaluating various sets of fault models. |
| first_indexed | 2024-03-10T04:15:01Z |
| format | Article |
| id | doaj.art-6affc113817c49a2a0759baeed6d80b6 |
| institution | Directory Open Access Journal |
| issn | 2079-9292 |
| language | English |
| last_indexed | 2024-03-10T04:15:01Z |
| publishDate | 2021-12-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Electronics |
| spelling | doaj.art-6affc113817c49a2a0759baeed6d80b62023-11-23T08:02:57ZengMDPI AGElectronics2079-92922021-12-011024316010.3390/electronics10243160Analysis of Single Event Effects on Embedded ProcessorSarah Azimi0Corrado De Sio1Daniele Rizzieri2Luca Sterpone3Dipartimento di Automatica e Informatica (DAUIN), Politecnico di Torino, 10129 Turin, ItalyDipartimento di Automatica e Informatica (DAUIN), Politecnico di Torino, 10129 Turin, ItalyDipartimento di Automatica e Informatica (DAUIN), Politecnico di Torino, 10129 Turin, ItalyDipartimento di Automatica e Informatica (DAUIN), Politecnico di Torino, 10129 Turin, ItalyThe continuous scaling of electronic components has led to the development of high-performance microprocessors which are even suitable for safety-critical applications where radiation-induced errors, such as single event effects (SEEs), are one of the most important reliability issues. This work focuses on the development of a fault injection environment capable of analyzing the impact of errors on the functionality of an ARM Cortex-A9 microprocessor embedded within a Zynq-7000 AP-SoC, considering different fault models affecting both the system memory and register resources of the embedded processor. We developed a novel Python-based fault injection platform for the emulation of radiation-induced faults within the AP-SoC hardware resources during the execution of software applications. The fault injection approach is not intrusive, and it does not require modifying the software application under evaluation. The experimental analyses have been performed on a subset of the MiBench benchmark software suite. Fault injection results demonstrate the capability of the developed method and the possibility of evaluating various sets of fault models.https://www.mdpi.com/2079-9292/10/24/3160embedded processorreliabilitysingle event effects |
| spellingShingle | Sarah Azimi Corrado De Sio Daniele Rizzieri Luca Sterpone Analysis of Single Event Effects on Embedded Processor Electronics embedded processor reliability single event effects |
| title | Analysis of Single Event Effects on Embedded Processor |
| title_full | Analysis of Single Event Effects on Embedded Processor |
| title_fullStr | Analysis of Single Event Effects on Embedded Processor |
| title_full_unstemmed | Analysis of Single Event Effects on Embedded Processor |
| title_short | Analysis of Single Event Effects on Embedded Processor |
| title_sort | analysis of single event effects on embedded processor |
| topic | embedded processor reliability single event effects |
| url | https://www.mdpi.com/2079-9292/10/24/3160 |
| work_keys_str_mv | AT sarahazimi analysisofsingleeventeffectsonembeddedprocessor AT corradodesio analysisofsingleeventeffectsonembeddedprocessor AT danielerizzieri analysisofsingleeventeffectsonembeddedprocessor AT lucasterpone analysisofsingleeventeffectsonembeddedprocessor |