A critical-point yield model to appraise the damage caused to soybean by white-mold

A model to estimate the damage caused by white mold to soybean yield from experimental field data gathered during the summer season of 2009-10 was generated. Six soybean cultivars were grown on six sites of the Cerrados region, resulting in a total of nine separate experiments. The gradient of disea...

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Bibliographic Details
Main Authors: Erlei M. Reis, Mateus Zanatta, Fernando Cezar Juliatti, Hercules D. Campos, Luis Henrique Carregal P. Silva, Maurício C. Meyer, José Nunes Junior, Cláudia B. Pimenta, Daniel Cassetari Neto, Andréia Q. Machado, Carlos M. Utiamada
Format: Article
Language:English
Published: Universidade Federal de Uberlândia 2020-08-01
Series:Bioscience Journal
Subjects:
Online Access:http://www.seer.ufu.br/index.php/biosciencejournal/article/view/55438