Digital Twin for Training Bayesian Networks for Fault Diagnostics of Manufacturing Systems

Smart manufacturing systems are being advocated to leverage technological advances that enable them to be more resilient to faults through rapid diagnosis for performance assurance. In this paper, we propose a co-simulation approach for engineering digital twins (DTs) that are used to train Bayesian...

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Bibliographic Details
Main Authors: Toyosi Ademujimi, Vittaldas Prabhu
Format: Article
Language:English
Published: MDPI AG 2022-02-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/22/4/1430