Digital Twin for Training Bayesian Networks for Fault Diagnostics of Manufacturing Systems
Smart manufacturing systems are being advocated to leverage technological advances that enable them to be more resilient to faults through rapid diagnosis for performance assurance. In this paper, we propose a co-simulation approach for engineering digital twins (DTs) that are used to train Bayesian...
Main Authors: | , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-02-01
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Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/22/4/1430 |