Approaches for Memristive Structures Using Scratching Probe Nanolithography: Towards Neuromorphic Applications

Approaches for Memristive Structures Using Scratching Probe Nanolithography: Towards Neuromorphic Applications

This paper proposes two different approaches to studying resistive switching of oxide thin films using scratching probe nanolithography of atomic force microscopy (AFM). These approaches allow us to assess the effects of memristor size and top-contact thickness on resistive switching. For that purpo...

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Bibliographic Details
Main Authors: Roman V. Tominov, Zakhar E. Vakulov, Vadim I. Avilov, Ivan A. Shikhovtsov, Vadim I. Varganov, Victor B. Kazantsev, Lovi Raj Gupta, Chander Prakash, Vladimir A. Smirnov
Format: Article
Language:English
Published: MDPI AG 2023-05-01
Series:Nanomaterials
Subjects:
artificial intelligence
neuromorphic systems
memristor
ReRAM
resistive switching
scratching probe nanolithography
Online Access:https://www.mdpi.com/2079-4991/13/10/1583

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https://www.mdpi.com/2079-4991/13/10/1583

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