Four-Point Measurement Setup for Correlative Microscopy of Nanowires

Four-Point Measurement Setup for Correlative Microscopy of Nanowires

The measurement method, which utilizes nanomanipulation of the nanowires onto a specially prepared substrate, was presented. It introduced a four-point resistance measurement setup on a chip suited for scanning probe microscopy measurements, integrating connectors and a nanowire specimen. A study on...

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Bibliographic Details
Main Authors: Bartosz C. Pruchnik, Janusz D. Fidelus, Ewelina Gacka, Krzysztof Kwoka, Julia Pruchnik, Adrianna Piejko, Łukasz Usydus, Leszek Zaraska, Grzegorz D. Sulka, Tomasz Piasecki, Teodor P. Gotszalk
Format: Article
Language:English
Published: MDPI AG 2023-08-01
Series:Nanomaterials
Subjects:
electrical measurements
four-point measurement
nanowires
nanowire resistance measurement
nanomanipulation
AFM
Online Access:https://www.mdpi.com/2079-4991/13/17/2451

Internet

https://www.mdpi.com/2079-4991/13/17/2451

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