Okapi-EM: A napari plugin for processing and analyzing cryogenic serial focused ion beam/scanning electron microscopy images

An emergent volume electron microscopy technique called cryogenic serial plasma focused ion beam milling scanning electron microscopy (pFIB/SEM) can decipher complex biological structures by building a three-dimensional picture of biological samples at mesoscale resolution. This is achieved by colle...

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Bibliographic Details
Main Authors: Luís M. A. Perdigão, Elaine M. L. Ho, Zhiyuan C. Cheng, Neville B.-Y. Yee, Thomas Glen, Liang Wu, Michael Grange, Maud Dumoux, Mark Basham, Michele C. Darrow
Format: Article
Language:English
Published: Cambridge University Press 2023-01-01
Series:Biological Imaging
Subjects:
Online Access:https://www.cambridge.org/core/product/identifier/S2633903X23000119/type/journal_article