Simulation of channeling contrast in scanning ion microscope images
The scanning ion microscope (SIM) provides a distinct channeling contrast in backscattered ion (BSI) and secondary electron (SE) images owing to its wide critical angle for ion channeling. In this report, we present a molecular dynamics (MD) simulation of a crystalline sample’s channeling contrast t...
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| Formato: | Artigo |
| Idioma: | English |
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AIP Publishing LLC
2018-01-01
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| coleção: | AIP Advances |
| Acesso em linha: | http://dx.doi.org/10.1063/1.5018126 |