Simulation of channeling contrast in scanning ion microscope images

The scanning ion microscope (SIM) provides a distinct channeling contrast in backscattered ion (BSI) and secondary electron (SE) images owing to its wide critical angle for ion channeling. In this report, we present a molecular dynamics (MD) simulation of a crystalline sample’s channeling contrast t...

詳細記述

書誌詳細
第一著者: Kaoru Ohya
フォーマット: 論文
言語:English
出版事項: AIP Publishing LLC 2018-01-01
シリーズ:AIP Advances
オンライン・アクセス:http://dx.doi.org/10.1063/1.5018126