Leather Defect Detection Method in Clothing Design Based on TDENet

Defect detection models generally require a large number of samples to learn the features of defects, but in practical scenarios, it is difficult to collect samples of important defects. How to use a small number of samples to learn the features of rare defects has become a challenging problem. In o...

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Bibliographic Details
Main Authors: Fen Wang, Kim Ju Kyoung
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10229117/