Leather Defect Detection Method in Clothing Design Based on TDENet
Defect detection models generally require a large number of samples to learn the features of defects, but in practical scenarios, it is difficult to collect samples of important defects. How to use a small number of samples to learn the features of rare defects has become a challenging problem. In o...
Main Authors: | Fen Wang, Kim Ju Kyoung |
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Format: | Article |
Language: | English |
Published: |
IEEE
2023-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/10229117/ |
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