Effect of Process Parameters on Mode Conversion in Submicron Tapered Silicon Ridge Waveguides

Effect of Process Parameters on Mode Conversion in Submicron Tapered Silicon Ridge Waveguides

The modal property and light propagation in tapered silicon ridge waveguides with different ridge heights are investigated for a silicon on insulator (SOI) platform with a 500 nm silicon (Si) thickness. Mode conversion between the transverse magnetic (TM) fundamental and higher-order transverse elec...

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Dettagli Bibliografici
Autori principali:	Zakriya Mohammed, Bruna Paredes, Mahmoud Rasras
Natura:	Articolo
Lingua:	English
Pubblicazione:	MDPI AG 2021-03-01
Serie:	Applied Sciences
Soggetti:	photonic integrated circuits silicon photonics mode hybridization mode converters polarization splitter and rotators tapered waveguides
Accesso online:	https://www.mdpi.com/2076-3417/11/5/2366

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