Research on surface defect detection of glass wafer based on visual inspection

Glass wafer (GW) is used in a variety of integrated circuit (IC) packaging applications and as substrates to provide better performance and cost-effectiveness. Glass wafer (GW) protects the IC from impact and corrosion while maintaining the contract pins and leads that connect it to the external cir...

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Bibliographic Details
Main Authors: Zhangyu Huang, Long Ling
Format: Article
Language:English
Published: Elsevier 2022-11-01
Series:Energy Reports
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2352484722018534