Research on surface defect detection of glass wafer based on visual inspection
Glass wafer (GW) is used in a variety of integrated circuit (IC) packaging applications and as substrates to provide better performance and cost-effectiveness. Glass wafer (GW) protects the IC from impact and corrosion while maintaining the contract pins and leads that connect it to the external cir...
Main Authors: | Zhangyu Huang, Long Ling |
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Format: | Article |
Language: | English |
Published: |
Elsevier
2022-11-01
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Series: | Energy Reports |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2352484722018534 |
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