Anisotropic peak broadening analysis of SRS diffraction from twin microstructurs in YBCO sample
Reitveld full profile refinement analysis has been done on Synchrotron diffraction data from a powder sample of YBCOx at RT and 500°C. Anisotropic peak broadening for (h00) and (hh0) lines has been observed by Williamson-Hall (W-H) analysis and that is in agreement with formation of twin's micr...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Isfahan University of Technology
2010-09-01
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| Series: | Iranian Journal of Physics Research |
| Subjects: | |
| Online Access: | http://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-469&slc_lang=en&sid=1 |