Dynamic Line Scan Thermography Parameter Design via Gaussian Process Emulation

Dynamic Line Scan Thermography Parameter Design via Gaussian Process Emulation

We address the challenge of determining a valid set of parameters for a dynamic line scan thermography setup. Traditionally, this optimization process is labor- and time-intensive work, even for an expert skilled in the art. Nowadays, simulations in software can reduce some of that burden. However,...

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Bibliographic Details
Main Authors: Simon Verspeek, Ivan De Boi, Xavier Maldague, Rudi Penne, Gunther Steenackers
Format: Article
Language:English
Published: MDPI AG 2022-03-01
Series:Algorithms
Subjects:
active thermography
parameter design
emulation
Gaussian process
Online Access:https://www.mdpi.com/1999-4893/15/4/102

Internet

https://www.mdpi.com/1999-4893/15/4/102

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