Artificial Scanning Electron Microscopy Images Created by Generative Adversarial Networks from Simulated Particle Assemblies

Artificial Scanning Electron Microscopy Images Created by Generative Adversarial Networks from Simulated Particle Assemblies

Particle assemblies created by software package Blender are converted into artificial scanning electron micrographs (SEM) with a generative adversarial network (GAN). The introduction of height maps (i.e., surface topography or relief structure) considerably enhances the quality of the artificial SE...

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Bibliographic Details
Main Authors: Jonas Bals, Matthias Epple
Format: Article
Language:English
Published: Wiley 2023-07-01
Series:Advanced Intelligent Systems
Subjects:
artificial intelligence
deep learning
electron microscopy
generative adversarial networks
nanoparticles
particle size
Online Access:https://doi.org/10.1002/aisy.202300004

Internet

https://doi.org/10.1002/aisy.202300004

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