Artificial Scanning Electron Microscopy Images Created by Generative Adversarial Networks from Simulated Particle Assemblies
Particle assemblies created by software package Blender are converted into artificial scanning electron micrographs (SEM) with a generative adversarial network (GAN). The introduction of height maps (i.e., surface topography or relief structure) considerably enhances the quality of the artificial SE...
Main Authors: | Jonas Bals, Matthias Epple |
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Format: | Article |
Language: | English |
Published: |
Wiley
2023-07-01
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Series: | Advanced Intelligent Systems |
Subjects: | |
Online Access: | https://doi.org/10.1002/aisy.202300004 |
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