Optoelectronic Properties of Atomically Thin Mo<sub><i>x</i></sub>W<sub>(1−<i>x</i>)</sub>S<sub>2</sub> Nanoflakes Probed by Spatially-Resolved Monochromated EELS

Optoelectronic Properties of Atomically Thin Mo<sub><i>x</i></sub>W<sub>(1−<i>x</i>)</sub>S<sub>2</sub> Nanoflakes Probed by Spatially-Resolved Monochromated EELS

Band gap engineering of atomically thin two-dimensional (2D) materials has attracted a huge amount of interest as a key aspect to the application of these materials in nanooptoelectronics and nanophotonics. Low-loss electron energy loss spectroscopy has been employed to perform a direct measurement...

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Bibliographic Details
Main Authors: Mario Pelaez-Fernandez, Yung-Chang Lin, Kazu Suenaga, Raul Arenal
Format: Article
Language:English
Published: MDPI AG 2021-11-01
Series:Nanomaterials
Subjects:
band gap measurement
band gap engineering
optoelectronics
EELS
transition metal dichalcogenides
2D materials
Online Access:https://www.mdpi.com/2079-4991/11/12/3218

Internet

https://www.mdpi.com/2079-4991/11/12/3218

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