P3HT:PCBM blend films phase diagram on the base of variable-temperature spectroscopic ellipsometry

P3HT:PCBM blend films phase diagram on the base of variable-temperature spectroscopic ellipsometry

In this work we present an in-depth study of the how the composition of poly(3-hexylthiophene) (P3HT):[6,6]-phenyl-C61-butyric acid methyl ester (PCBM) blend films influences their phase transitions using variable-temperature spectroscopic ellipsometry. We demonstrate that this non-destructive metho...

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Bibliographic Details
Main Authors: Barbara Hajduk, Henryk Bednarski, Bożena Jarząbek, Henryk Janeczek, Paweł Nitschke
Format: Article
Language:English
Published: Beilstein-Institut 2018-04-01
Series:Beilstein Journal of Nanotechnology
Subjects:
non-linear optics
organic semiconductors
spectroscopic ellipsometry
theoretical modeling
thin films
Online Access:https://doi.org/10.3762/bjnano.9.102

Internet

https://doi.org/10.3762/bjnano.9.102

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