X‐Ray Microscopy: A Non‐Destructive Multi‐Scale Imaging to Study the Inner Workings of Batteries

Abstract X‐ray microscopy (XRM) is a non‐destructive characterization technique that provides quantitative information regarding the morphology/composition of the specimen and allows to perform multiscale and multimodal 2D/3D experiments exploiting the radiation‐matter interactions. XRM is particula...

Full description

Bibliographic Details
Main Authors: Dr. Flavio Cognigni, Prof. Mauro Pasquali, Dr. Pier Paolo Prosini, Dr. Claudia Paoletti, Dr. Annalisa Aurora, Dr. Francesca Anna Scaramuzzo, Prof. Marco Rossi
Format: Article
Language:English
Published: Wiley-VCH 2023-04-01
Series:ChemElectroChem
Subjects:
Online Access:https://doi.org/10.1002/celc.202201081