X‐Ray Microscopy: A Non‐Destructive Multi‐Scale Imaging to Study the Inner Workings of Batteries

Abstract X‐ray microscopy (XRM) is a non‐destructive characterization technique that provides quantitative information regarding the morphology/composition of the specimen and allows to perform multiscale and multimodal 2D/3D experiments exploiting the radiation‐matter interactions. XRM is particula...

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Main Authors: Dr. Flavio Cognigni, Prof. Mauro Pasquali, Dr. Pier Paolo Prosini, Dr. Claudia Paoletti, Dr. Annalisa Aurora, Dr. Francesca Anna Scaramuzzo, Prof. Marco Rossi
格式: 文件
语言:English
出版: Wiley-VCH 2023-04-01
丛编:ChemElectroChem
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在线阅读:https://doi.org/10.1002/celc.202201081