An efficient framework for deep learning‐based light‐defect image enhancement

Abstract The enhancement of light‐defect images such as extremely low‐light, low‐light and dim‐light has always been a research hotspot. Most of the existing methods are excellent in specific illuminations, and there is much room for improvement in processing light‐defect images with different illum...

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Bibliographic Details
Main Authors: Chengxu Ma, Daihui Li, Shangyou Zeng, Junbo Zhao, Hongyang Chen
Format: Article
Language:English
Published: Wiley 2021-05-01
Series:IET Image Processing
Subjects:
Online Access:https://doi.org/10.1049/ipr2.12125