An efficient framework for deep learning‐based light‐defect image enhancement
Abstract The enhancement of light‐defect images such as extremely low‐light, low‐light and dim‐light has always been a research hotspot. Most of the existing methods are excellent in specific illuminations, and there is much room for improvement in processing light‐defect images with different illum...
Main Authors: | Chengxu Ma, Daihui Li, Shangyou Zeng, Junbo Zhao, Hongyang Chen |
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Format: | Article |
Language: | English |
Published: |
Wiley
2021-05-01
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Series: | IET Image Processing |
Subjects: | |
Online Access: | https://doi.org/10.1049/ipr2.12125 |
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