Effect of Temperature on Reliability and Degradation of 0.63?m Laser Diode
The reliability of optical sources is strongly dependent on the degradation and device characteristics are critically dependent on temperature. The degradation behaviours and reliability test results for the laser diode device (Sony-DL3148-025) will be presented .These devices are usually highly rel...
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| Format: | Article |
| Language: | Arabic |
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College of Science for Women, University of Baghdad
2012-03-01
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| Series: | Baghdad Science Journal |
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| Online Access: | http://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/1344 |