Electron mobility enhancement in n-GaN under Ohmic-metal

We investigated the electron transport properties of n-GaN under an Ohmic-metal. Hall measurement results were compared for n-GaN (A) before Ti-based metal deposition, (B) after Ti-based metal deposition but before annealing, (C) after Ohmic annealing, and (D) after Ohmic-metal removal, where multi-...

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Bibliographic Details
Main Authors: Kazuya Uryu, Yuchen Deng, Son Phuong Le, Toshi-kazu Suzuki
Format: Article
Language:English
Published: AIP Publishing LLC 2023-07-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0147137