Three-dimensional reconstruction of Y-IrNi rhombic dodecahedron nanoframe by STEM/EDS tomography
Abstract The structural analysis of nanocrystals via transmission electron microscopy (TEM) is a valuable technique for the material science field. Recently, two-dimensional images by scanning TEM (STEM) and energy-dispersive X-ray spectroscopy (EDS) have successfully extended to three-dimensional (...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
SpringerOpen
2023-09-01
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Series: | Applied Microscopy |
Subjects: | |
Online Access: | https://doi.org/10.1186/s42649-023-00092-7 |