Three-dimensional reconstruction of Y-IrNi rhombic dodecahedron nanoframe by STEM/EDS tomography

Abstract The structural analysis of nanocrystals via transmission electron microscopy (TEM) is a valuable technique for the material science field. Recently, two-dimensional images by scanning TEM (STEM) and energy-dispersive X-ray spectroscopy (EDS) have successfully extended to three-dimensional (...

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Bibliographic Details
Main Authors: Taekyung Kim, Yongsang Lee, Yongju Hong, Kwangyeol Lee, Hionsuck Baik
Format: Article
Language:English
Published: SpringerOpen 2023-09-01
Series:Applied Microscopy
Subjects:
Online Access:https://doi.org/10.1186/s42649-023-00092-7