The basics of radiation damage in crystalline silicon networks by NIEL

The basics of radiation damage in crystalline silicon networks by NIEL

Basically, radiation can cause two effects on materials: ionization and non-ionization. This work presented the theory involved in defects caused by non-ionization, known as NIEL, with a focus on silicon materials. When energy is transferred directly to the atoms in the crystalline lattice, it can...

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Bibliographic Details
Main Authors: Carla Daruich de Souza, Jong Bun KIM, Jin Joo KIM, Jin KIM, Wanook JI, Kwang Jae SON, Sang Mu CHOI, Gu Jin KANG, Jin Te HONG
Format: Article
Language:English
Published: Brazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR) 2021-09-01
Series:Brazilian Journal of Radiation Sciences
Subjects:
Non-ionizing energy loss
NIEL
radiation damage
diodes
silicon
nuclear reactor monitoring
Online Access:https://bjrs.org.br/revista/index.php/REVISTA/article/view/1707

Internet

https://bjrs.org.br/revista/index.php/REVISTA/article/view/1707

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