The basics of radiation damage in crystalline silicon networks by NIEL
Basically, radiation can cause two effects on materials: ionization and non-ionization. This work presented the theory involved in defects caused by non-ionization, known as NIEL, with a focus on silicon materials. When energy is transferred directly to the atoms in the crystalline lattice, it can...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Brazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR)
2021-09-01
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| Series: | Brazilian Journal of Radiation Sciences |
| Subjects: | |
| Online Access: | https://bjrs.org.br/revista/index.php/REVISTA/article/view/1707 |
| _version_ | 1798027462574080000 |
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| author | Carla Daruich de Souza Jong Bun KIM Jin Joo KIM Jin KIM Wanook JI Kwang Jae SON Sang Mu CHOI Gu Jin KANG Jin Te HONG |
| author_facet | Carla Daruich de Souza Jong Bun KIM Jin Joo KIM Jin KIM Wanook JI Kwang Jae SON Sang Mu CHOI Gu Jin KANG Jin Te HONG |
| author_sort | Carla Daruich de Souza |
| collection | DOAJ |
| description |
Basically, radiation can cause two effects on materials: ionization and non-ionization. This work presented the theory involved in defects caused by non-ionization, known as NIEL, with a focus on silicon materials. When energy is transferred directly to the atoms in the crystalline lattice, it can either be dissipated in the form of vibrations or be large enough to pull atoms out of that lattice. This weakens the lattice, causing measurement errors that can lead to permanent damage. This study is extremely important because silicon materials are used in radiation detectors. These detectors cannot return false measurements, especially in dangerous situations, such as in nuclear reactor monitoring. After presenting the theory involved, examples are shown. Failures of up to 30% were found by the researchers.
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| first_indexed | 2024-04-11T18:51:55Z |
| format | Article |
| id | doaj.art-718dc62dc0524021b68bfaf788e4f2b9 |
| institution | Directory Open Access Journal |
| issn | 2319-0612 |
| language | English |
| last_indexed | 2024-04-11T18:51:55Z |
| publishDate | 2021-09-01 |
| publisher | Brazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR) |
| record_format | Article |
| series | Brazilian Journal of Radiation Sciences |
| spelling | doaj.art-718dc62dc0524021b68bfaf788e4f2b92022-12-22T04:08:20ZengBrazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR)Brazilian Journal of Radiation Sciences2319-06122021-09-019310.15392/bjrs.v9i3.1707The basics of radiation damage in crystalline silicon networks by NIELCarla Daruich de Souza0Jong Bun KIMJin Joo KIMJin KIMWanook JIKwang Jae SONSang Mu CHOIGu Jin KANGJin Te HONGKaeri - Korea Atomic Energy Research Institute Basically, radiation can cause two effects on materials: ionization and non-ionization. This work presented the theory involved in defects caused by non-ionization, known as NIEL, with a focus on silicon materials. When energy is transferred directly to the atoms in the crystalline lattice, it can either be dissipated in the form of vibrations or be large enough to pull atoms out of that lattice. This weakens the lattice, causing measurement errors that can lead to permanent damage. This study is extremely important because silicon materials are used in radiation detectors. These detectors cannot return false measurements, especially in dangerous situations, such as in nuclear reactor monitoring. After presenting the theory involved, examples are shown. Failures of up to 30% were found by the researchers. https://bjrs.org.br/revista/index.php/REVISTA/article/view/1707Non-ionizing energy lossNIELradiation damagediodessiliconnuclear reactor monitoring |
| spellingShingle | Carla Daruich de Souza Jong Bun KIM Jin Joo KIM Jin KIM Wanook JI Kwang Jae SON Sang Mu CHOI Gu Jin KANG Jin Te HONG The basics of radiation damage in crystalline silicon networks by NIEL Brazilian Journal of Radiation Sciences Non-ionizing energy loss NIEL radiation damage diodes silicon nuclear reactor monitoring |
| title | The basics of radiation damage in crystalline silicon networks by NIEL |
| title_full | The basics of radiation damage in crystalline silicon networks by NIEL |
| title_fullStr | The basics of radiation damage in crystalline silicon networks by NIEL |
| title_full_unstemmed | The basics of radiation damage in crystalline silicon networks by NIEL |
| title_short | The basics of radiation damage in crystalline silicon networks by NIEL |
| title_sort | basics of radiation damage in crystalline silicon networks by niel |
| topic | Non-ionizing energy loss NIEL radiation damage diodes silicon nuclear reactor monitoring |
| url | https://bjrs.org.br/revista/index.php/REVISTA/article/view/1707 |
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