SURE-Fuse WFF: A Multi-Resolution Windowed Fourier Analysis for Interferometric Phase Denoising

SURE-Fuse WFF: A Multi-Resolution Windowed Fourier Analysis for Interferometric Phase Denoising

Interferometric phase (InPhase) images, acquired by phase imaging systems, often suffer from two major degradations: 1) phase wrapping, caused by the sinusoidal 2π-periodic sensing mechanism, and 2) noise, introduced by the acquisition process or the system. This work focuses on InPhase d...

Full description

Bibliographic Details
Main Authors: Joshin P. Krishnan, Mario A. T. Figueiredo, Jose M. Bioucas-Dias
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Phase estimation
interferometric phase estimation
interferometry
phase unwrapping
Stein’s unbiased risk estimate (SURE)
windowed Fourier transform (WFT)
Online Access:https://ieeexplore.ieee.org/document/8809725/

Internet

https://ieeexplore.ieee.org/document/8809725/

Similar Items