Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps

Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps

For the precise determination of orientations in polycrystalline materials, electron backscatter diffraction (EBSD) requires a consistent calibration of the diffraction geometry in the scanning electron microscope (SEM). In the present paper, the variation of the projection center for the Kikuchi di...

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Bibliographic Details
Main Authors: Aimo Winkelmann, Gert Nolze, Grzegorz Cios, Tomasz Tokarski, Piotr Bała
Format: Article
Language:English
Published: MDPI AG 2020-06-01
Series:Materials
Subjects:
scanning electron microscopy
electron backscatter diffraction
Kikuchi diffraction
projection center
orientation precision
Online Access:https://www.mdpi.com/1996-1944/13/12/2816

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https://www.mdpi.com/1996-1944/13/12/2816

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