Strain Profile in the Subsurface of He-Ion-Irradiated Tungsten Accessed by S-GIXRD

Strain Profile in the Subsurface of He-Ion-Irradiated Tungsten Accessed by S-GIXRD

The strain profile in the subsurface of He-ion-irradiated W was figured out by unfolding the synchrotron-grazing incidence X-ray diffraction (S-GIXRD) patterns at different incidence angles. The results show that for 2 × 10<sup>21</sup> ions/m<sup>2</sup> He<sup>2+</...

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Bibliographic Details
Main Authors: Wenjie Huang, Meng Sun, Wen Wen, Junfeng Yang, Zhuoming Xie, Rui Liu, Xianping Wang, Xuebang Wu, Qianfeng Fang, Changsong Liu
Format: Article
Language:English
Published: MDPI AG 2022-05-01
Series:Crystals
Subjects:
nuclear materials
X-ray techniques
helium ion irradiation
strain profile
Online Access:https://www.mdpi.com/2073-4352/12/5/691

Internet

https://www.mdpi.com/2073-4352/12/5/691

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