Interpreting motion and force for narrow-band intermodulation atomic force microscopy

Interpreting motion and force for narrow-band intermodulation atomic force microscopy

Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip–surface force by measurement of the mixing of multiple modes in a frequency comb. A high-quality factor cantilever resonance and a suitable drive comb will result in tip motion...

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Bibliographic Details
Main Authors: Daniel Platz, Daniel Forchheimer, Erik A. Tholén, David B. Haviland
Format: Article
Language:English
Published: Beilstein-Institut 2013-01-01
Series:Beilstein Journal of Nanotechnology
Subjects:
atomic force microscopy
AFM
frequency combs
force spectroscopy
high-quality-factor resonators
intermodulation
multifrequency
Online Access:https://doi.org/10.3762/bjnano.4.5

Internet

https://doi.org/10.3762/bjnano.4.5

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