Interpreting motion and force for narrow-band intermodulation atomic force microscopy
Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip–surface force by measurement of the mixing of multiple modes in a frequency comb. A high-quality factor cantilever resonance and a suitable drive comb will result in tip motion...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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Beilstein-Institut
2013-01-01
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| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.4.5 |
| _version_ | 1828492966504693760 |
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| author | Daniel Platz Daniel Forchheimer Erik A. Tholén David B. Haviland |
| author_facet | Daniel Platz Daniel Forchheimer Erik A. Tholén David B. Haviland |
| author_sort | Daniel Platz |
| collection | DOAJ |
| description | Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip–surface force by measurement of the mixing of multiple modes in a frequency comb. A high-quality factor cantilever resonance and a suitable drive comb will result in tip motion described by a narrow-band frequency comb. We show, by a separation of time scales, that such motion is equivalent to rapid oscillations at the cantilever resonance with a slow amplitude and phase or frequency modulation. With this time-domain perspective, we analyze single oscillation cycles in ImAFM to extract the Fourier components of the tip–surface force that are in-phase with the tip motion (FI) and quadrature to the motion (FQ). Traditionally, these force components have been considered as a function of the static-probe height only. Here we show that FI and FQ actually depend on both static-probe height and oscillation amplitude. We demonstrate on simulated data how to reconstruct the amplitude dependence of FI and FQ from a single ImAFM measurement. Furthermore, we introduce ImAFM approach measurements with which we reconstruct the full amplitude and probe-height dependence of the force components FI and FQ, providing deeper insight into the tip–surface interaction. We demonstrate the capabilities of ImAFM approach measurements on a polystyrene polymer surface. |
| first_indexed | 2024-12-11T11:29:35Z |
| format | Article |
| id | doaj.art-731987fede324ea99a83e73dc3322702 |
| institution | Directory Open Access Journal |
| issn | 2190-4286 |
| language | English |
| last_indexed | 2024-12-11T11:29:35Z |
| publishDate | 2013-01-01 |
| publisher | Beilstein-Institut |
| record_format | Article |
| series | Beilstein Journal of Nanotechnology |
| spelling | doaj.art-731987fede324ea99a83e73dc33227022022-12-22T01:08:54ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862013-01-0141455610.3762/bjnano.4.52190-4286-4-5Interpreting motion and force for narrow-band intermodulation atomic force microscopyDaniel Platz0Daniel Forchheimer1Erik A. Tholén2David B. Haviland3Royal Institute of Technology (KTH), Section for Nanostructure Physics, Albanova University Center, SE-106 91 Stockholm, SwedenRoyal Institute of Technology (KTH), Section for Nanostructure Physics, Albanova University Center, SE-106 91 Stockholm, SwedenIntermodulation Products AB, Vasavägen 29, SE-169 58 Solna, SwedenRoyal Institute of Technology (KTH), Section for Nanostructure Physics, Albanova University Center, SE-106 91 Stockholm, SwedenIntermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip–surface force by measurement of the mixing of multiple modes in a frequency comb. A high-quality factor cantilever resonance and a suitable drive comb will result in tip motion described by a narrow-band frequency comb. We show, by a separation of time scales, that such motion is equivalent to rapid oscillations at the cantilever resonance with a slow amplitude and phase or frequency modulation. With this time-domain perspective, we analyze single oscillation cycles in ImAFM to extract the Fourier components of the tip–surface force that are in-phase with the tip motion (FI) and quadrature to the motion (FQ). Traditionally, these force components have been considered as a function of the static-probe height only. Here we show that FI and FQ actually depend on both static-probe height and oscillation amplitude. We demonstrate on simulated data how to reconstruct the amplitude dependence of FI and FQ from a single ImAFM measurement. Furthermore, we introduce ImAFM approach measurements with which we reconstruct the full amplitude and probe-height dependence of the force components FI and FQ, providing deeper insight into the tip–surface interaction. We demonstrate the capabilities of ImAFM approach measurements on a polystyrene polymer surface.https://doi.org/10.3762/bjnano.4.5atomic force microscopyAFMfrequency combsforce spectroscopyhigh-quality-factor resonatorsintermodulationmultifrequency |
| spellingShingle | Daniel Platz Daniel Forchheimer Erik A. Tholén David B. Haviland Interpreting motion and force for narrow-band intermodulation atomic force microscopy Beilstein Journal of Nanotechnology atomic force microscopy AFM frequency combs force spectroscopy high-quality-factor resonators intermodulation multifrequency |
| title | Interpreting motion and force for narrow-band intermodulation atomic force microscopy |
| title_full | Interpreting motion and force for narrow-band intermodulation atomic force microscopy |
| title_fullStr | Interpreting motion and force for narrow-band intermodulation atomic force microscopy |
| title_full_unstemmed | Interpreting motion and force for narrow-band intermodulation atomic force microscopy |
| title_short | Interpreting motion and force for narrow-band intermodulation atomic force microscopy |
| title_sort | interpreting motion and force for narrow band intermodulation atomic force microscopy |
| topic | atomic force microscopy AFM frequency combs force spectroscopy high-quality-factor resonators intermodulation multifrequency |
| url | https://doi.org/10.3762/bjnano.4.5 |
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