Single-pulse characterization of the focal spot size of X-ray free-electron lasers using coherent diffraction imaging

Single-pulse characterization of the focal spot size of X-ray free-electron lasers using coherent diffraction imaging

The characterization of X-ray focal spots is of great significance for the diagnosis and performance optimization of focusing systems. X-ray free-electron lasers (XFELs) are the latest generation of X-ray sources with ultrahigh brilliance, ultrashort pulse duration and nearly full transverse coheren...

Full description

Bibliographic Details
Main Authors: Zichen Gao, Jiadong Fan, Yajun Tong, Jianhua Zhang, Bo He, Yonggan Nie, Hui Luan, Donghao Lu, Difei Zhang, Xinye Yuan, Yueran Wang, Zhi Liu, Huaidong Jiang
Format: Article
Language:English
Published: International Union of Crystallography 2023-05-01
Series:Journal of Synchrotron Radiation
Subjects:
x-ray free-electron laser
coherent diffraction imaging
spot size characterization
kb focusing
Online Access:http://scripts.iucr.org/cgi-bin/paper?S1600577523000887

Internet

http://scripts.iucr.org/cgi-bin/paper?S1600577523000887

Similar Items