Analysis of Total Ionizing Dose Effects on 0.13µm Technology-Temperature-Compensated Voltage References
http://dx.doi.org/10.5028/jatm.v5i3.227 The purpose of this work is to briefly discuss the effects of the total ionizing dose (TID) on MOS devices in order to estimate the results of future irradiation tests on temperature-compensated voltage references that are implemented on a mixed-signal chip f...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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Instituto de Aeronáutica e Espaço (IAE)
2013-08-01
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| Series: | Journal of Aerospace Technology and Management |
| Subjects: | |
| Online Access: | https://www.jatm.com.br/jatm/article/view/227 |
| _version_ | 1811287245789855744 |
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| author | Thiago Hanna Both Dalton Colombo Ricardo Vanni Dallasen Gilson Inácio Wirth |
| author_facet | Thiago Hanna Both Dalton Colombo Ricardo Vanni Dallasen Gilson Inácio Wirth |
| author_sort | Thiago Hanna Both |
| collection | DOAJ |
| description |
http://dx.doi.org/10.5028/jatm.v5i3.227
The purpose of this work is to briefly discuss the effects of the total ionizing dose (TID) on MOS devices in order to estimate the results of future irradiation tests on temperature-compensated voltage references that are implemented on a mixed-signal chip fabricated using IBM 0.13 μm technology. The analysis will mainly focus on the effects of the parametric variations on different voltage references. Monte-Carlo analyses were performed in order to determine the effects of threshold voltage shifts in each transistor on the output voltage.
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| first_indexed | 2024-04-13T03:14:07Z |
| format | Article |
| id | doaj.art-73b78961d1584a878c6df264ea603a5b |
| institution | Directory Open Access Journal |
| issn | 2175-9146 |
| language | English |
| last_indexed | 2024-04-13T03:14:07Z |
| publishDate | 2013-08-01 |
| publisher | Instituto de Aeronáutica e Espaço (IAE) |
| record_format | Article |
| series | Journal of Aerospace Technology and Management |
| spelling | doaj.art-73b78961d1584a878c6df264ea603a5b2022-12-22T03:04:57ZengInstituto de Aeronáutica e Espaço (IAE)Journal of Aerospace Technology and Management2175-91462013-08-0153Analysis of Total Ionizing Dose Effects on 0.13µm Technology-Temperature-Compensated Voltage ReferencesThiago Hanna Both0Dalton Colombo1Ricardo Vanni Dallasen2Gilson Inácio Wirth3PGMICRO - Universidade Federal do Rio Grande do Sul (UFRGS)PGMicro - Universidade Federal do Rio Grande do Sul (UFRGS)PPGEE - Universidade Federal do Rio Grande do Sul (UFRGS)PGMicro - Universidade Federal do Rio Grande do Sul (UFRGS) http://dx.doi.org/10.5028/jatm.v5i3.227 The purpose of this work is to briefly discuss the effects of the total ionizing dose (TID) on MOS devices in order to estimate the results of future irradiation tests on temperature-compensated voltage references that are implemented on a mixed-signal chip fabricated using IBM 0.13 μm technology. The analysis will mainly focus on the effects of the parametric variations on different voltage references. Monte-Carlo analyses were performed in order to determine the effects of threshold voltage shifts in each transistor on the output voltage. https://www.jatm.com.br/jatm/article/view/227Ionizing doseRadiationTIDVoltage reference |
| spellingShingle | Thiago Hanna Both Dalton Colombo Ricardo Vanni Dallasen Gilson Inácio Wirth Analysis of Total Ionizing Dose Effects on 0.13µm Technology-Temperature-Compensated Voltage References Journal of Aerospace Technology and Management Ionizing dose Radiation TID Voltage reference |
| title | Analysis of Total Ionizing Dose Effects on 0.13µm Technology-Temperature-Compensated Voltage References |
| title_full | Analysis of Total Ionizing Dose Effects on 0.13µm Technology-Temperature-Compensated Voltage References |
| title_fullStr | Analysis of Total Ionizing Dose Effects on 0.13µm Technology-Temperature-Compensated Voltage References |
| title_full_unstemmed | Analysis of Total Ionizing Dose Effects on 0.13µm Technology-Temperature-Compensated Voltage References |
| title_short | Analysis of Total Ionizing Dose Effects on 0.13µm Technology-Temperature-Compensated Voltage References |
| title_sort | analysis of total ionizing dose effects on 0 13µm technology temperature compensated voltage references |
| topic | Ionizing dose Radiation TID Voltage reference |
| url | https://www.jatm.com.br/jatm/article/view/227 |
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