AMN: Attention Metric Network for One-Shot Remote Sensing Image Scene Classification
In recent years, deep neural network (DNN) based scene classification methods have achieved promising performance. However, the data-driven training strategy requires a large number of labeled samples, making the DNN-based methods unable to solve the scene classification problem in the case of a sma...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-12-01
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| Series: | Remote Sensing |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2072-4292/12/24/4046 |