Transient characterization of extreme field conduction in dielectrics
High field degradation and electric breakdown of dielectrics are extremely complex phenomena as a result of the interplay among the electric field, temperature, material morphology, and extrinsic material properties. Fundamental understanding of carrier mobility related prebreakdown phenomena in die...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2016-11-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4971158 |