Differentiated Protection and Hot/Cold-Aware Data Placement Policies through k-Means Clustering Analysis for 3D-NAND SSDs
3D-NAND flash memory provides high capacity per unit area by stacking 2D-NAND cells having a planar structure. However, because of the nature of the lamination process, the frequency of error occurrence varies depending on each layer or physical cell location. This phenomenon becomes more pronounced...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-01-01
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| Series: | Electronics |
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| Online Access: | https://www.mdpi.com/2079-9292/11/3/398 |