Performance Enhancement of Electrospun IGZO-Nanofiber-Based Field-Effect Transistors with High-<i>k</i> Gate Dielectrics through Microwave Annealing and Postcalcination Oxygen Plasma Treatment
We investigated the effects of various high-<i>k</i> gate dielectrics as well as microwave annealing (MWA) calcination and a postcalcination oxygen plasma treatment on the electrical properties and stability of electrospun indium gallium zinc oxide (IGZO)-nanofiber (NF)-based field-effec...
Main Authors: | , |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2020-09-01
|
Series: | Nanomaterials |
Subjects: | |
Online Access: | https://www.mdpi.com/2079-4991/10/9/1804 |