Thermal mathematical model of semiconductor devices for measurement of current-voltage characteristics by pulse method
The thermal mathematical model is used to estimate self-heating of semiconductor devices of various types during current-voltage characteristics measuring by the pulse method. The influence of self-heating on electrical parameters of semiconductor devices is analyzed. The recommendations for determi...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Politehperiodika
2012-10-01
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| Series: | Tekhnologiya i Konstruirovanie v Elektronnoi Apparature |
| Subjects: | |
| Online Access: | http://www.tkea.com.ua/tkea/2012/5_2012/pdf/03.zip |