Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion Method

Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion Method

This paper presents the implementation of the Bayesian inversion method for the characterization and estimation of different dielectric material properties. The scattering parameters of single and multi-layer materials are measured using a free-space experimental setup using a standard gain horn ant...

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Bibliographic Details
Main Authors: Saleem Shahid, Gian Guido Gentili, Giancarlo Bernasconi, Hamza Nawaz, Ahsan S. Rana
Format: Article
Language:English
Published: MDPI AG 2023-01-01
Series:Electronics
Subjects:
material characterization
Bayesian inversion method
relative permittivity
material thickness
s-parameters
eigenvectors
Online Access:https://www.mdpi.com/2079-9292/12/3/563

Internet

https://www.mdpi.com/2079-9292/12/3/563

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