Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion Method
This paper presents the implementation of the Bayesian inversion method for the characterization and estimation of different dielectric material properties. The scattering parameters of single and multi-layer materials are measured using a free-space experimental setup using a standard gain horn ant...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2023-01-01
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| Series: | Electronics |
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| Online Access: | https://www.mdpi.com/2079-9292/12/3/563 |
| _version_ | 1797624826284736512 |
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| author | Saleem Shahid Gian Guido Gentili Giancarlo Bernasconi Hamza Nawaz Ahsan S. Rana |
| author_facet | Saleem Shahid Gian Guido Gentili Giancarlo Bernasconi Hamza Nawaz Ahsan S. Rana |
| author_sort | Saleem Shahid |
| collection | DOAJ |
| description | This paper presents the implementation of the Bayesian inversion method for the characterization and estimation of different dielectric material properties. The scattering parameters of single and multi-layer materials are measured using a free-space experimental setup using a standard gain horn antenna and a Vector Network Analyzer (VNA) at Ka-band (26–40 GHz). The relative permittivity, material thickness, and material positioning error are defined as model parameters and estimated using the observed (measured) data. The FR4 Epoxy, Rogers RT/Duriod 5880, and Rogers AD600 with different relative permittivities and thicknesses are used in the measurement setup. The results displayed good agreement between model parameters and estimated properties of the presented materials, while the corresponding eigenvectors provided a level of confidence in model parameter values. The results were compared with different reported techniques to showcase the possible use of the presented method in microwave imaging, non-destructive testing, and similar applications. |
| first_indexed | 2024-03-11T09:48:10Z |
| format | Article |
| id | doaj.art-74b73040c0e745cd856f31f380cf95b6 |
| institution | Directory Open Access Journal |
| issn | 2079-9292 |
| language | English |
| last_indexed | 2024-03-11T09:48:10Z |
| publishDate | 2023-01-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Electronics |
| spelling | doaj.art-74b73040c0e745cd856f31f380cf95b62023-11-16T16:28:15ZengMDPI AGElectronics2079-92922023-01-0112356310.3390/electronics12030563Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion MethodSaleem Shahid0Gian Guido Gentili1Giancarlo Bernasconi2Hamza Nawaz3Ahsan S. Rana4Department of Electrical and Computer Engineering, Air University, Islamabad 44000, PakistanDepartment of Electronics, Information, and Bio-Engineering, Politecnico di Milano, 20133 Milan, ItalyDepartment of Electronics, Information, and Bio-Engineering, Politecnico di Milano, 20133 Milan, ItalySchool of Electrical, Information and Electronics Engineering, Shanghai Jiao Tong University, Shanghai 200240, ChinaDepartment of Electrical and Computer Engineering, Air University, Islamabad 44000, PakistanThis paper presents the implementation of the Bayesian inversion method for the characterization and estimation of different dielectric material properties. The scattering parameters of single and multi-layer materials are measured using a free-space experimental setup using a standard gain horn antenna and a Vector Network Analyzer (VNA) at Ka-band (26–40 GHz). The relative permittivity, material thickness, and material positioning error are defined as model parameters and estimated using the observed (measured) data. The FR4 Epoxy, Rogers RT/Duriod 5880, and Rogers AD600 with different relative permittivities and thicknesses are used in the measurement setup. The results displayed good agreement between model parameters and estimated properties of the presented materials, while the corresponding eigenvectors provided a level of confidence in model parameter values. The results were compared with different reported techniques to showcase the possible use of the presented method in microwave imaging, non-destructive testing, and similar applications.https://www.mdpi.com/2079-9292/12/3/563material characterizationBayesian inversion methodrelative permittivitymaterial thicknesss-parameterseigenvectors |
| spellingShingle | Saleem Shahid Gian Guido Gentili Giancarlo Bernasconi Hamza Nawaz Ahsan S. Rana Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion Method Electronics material characterization Bayesian inversion method relative permittivity material thickness s-parameters eigenvectors |
| title | Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion Method |
| title_full | Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion Method |
| title_fullStr | Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion Method |
| title_full_unstemmed | Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion Method |
| title_short | Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion Method |
| title_sort | multi layer material characterization at ka band using bayesian inversion method |
| topic | material characterization Bayesian inversion method relative permittivity material thickness s-parameters eigenvectors |
| url | https://www.mdpi.com/2079-9292/12/3/563 |
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