A Design Methodology for Reliable MRF-Based Logic Gates
Probabilistic-based methods have been used for designing noise tolerant circuits recently. In these methods, however, there is not any reliability mechanism that is essential for nanometer digital VLSI circuits. In this paper, we propose a novel method for designing reliable probabilistic-based logi...
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| Format: | Article |
| Language: | English |
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Iran University of Science and Technology
2019-09-01
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| Series: | Iranian Journal of Electrical and Electronic Engineering |
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| Online Access: | http://ijeee.iust.ac.ir/browse.php?a_code=A-10-2850-1&slc_lang=en&sid=1 |