Annealing effect on morphology, surface roughness and structure of thermally evaporated tin oxide thin films
SnO2 thin films were produced utilizing the Thermal Vacuum Evaporation method on quartz substrates. Three samples—FAA, FV-200, and FA-400—were made and labelled. While samples of the FV-200 and FA-400 were annealed at 200 ◦C and 400 ◦C, respectively, the as deposited thin film is FAA. The root mean...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
FLAYOO PUBLISHING HOUSE LIMITED
2023-11-01
|
| Series: | Recent Advances in Natural Sciences |
| Subjects: | |
| Online Access: | https://flayoophl.com/journals/index.php/rans/article/view/38 |