Swept-Source-Based Chromatic Confocal Microscopy

Swept-Source-Based Chromatic Confocal Microscopy

Chromatic confocal microscopy (CCM) has been intensively developed because it can exhibit effective focal position scanning based on the axial chromatic aberration of broadband light reflected from a target. To improve the imaging speed of three-dimensional (3D) surface profiling, we have proposed t...

Full description

Bibliographic Details
Main Authors: Dawoon Jeong, Se Jin Park, Hansol Jang, Hyunjoo Kim, Jaesun Kim, Chang-Seok Kim
Format: Article
Language:English
Published: MDPI AG 2020-12-01
Series:Sensors
Subjects:
chromatic confocal microscopy
chromatic aberration
swept-source
wavelength-swept laser
high-speed
3D surface profile
Online Access:https://www.mdpi.com/1424-8220/20/24/7347

Internet

https://www.mdpi.com/1424-8220/20/24/7347

Similar Items